Wafer inspection machine MTI Instruments
Proforma 300

Based on MTI Instruments' proprietary capacitance technology, the Proforma 300 can be used on all wafer materials including:

* Silicon
* Gallium-Arsenide
* Indium Phosphide
* Germanium

...without recalibrating or electrically grounding the wafer.

Fast, Accurate, and Reliable, the Proforma 300 measures wafers up to 300 mm in diameter for both thickness and total thickness variation (TTV)

Portable and Easy to Set Up, the Proforma 300 provides the user precise non-contact measurements at critical points throughout the wafer manufacturing process.

Thickness and TTV values are obtained by placing the wafer between MTI Instruments' non-contact capacitance probes. The Teflon coated wafer stage allows for easy, non-abrasive positioning of the wafer, while removable locating pins can be utilized for precise center thickness measurements. Thickness and TTV values are indicated on the high resolution LCD display.

An RS-232 port is provided for output to a personal computer, while a parallel port provides direct output to a printer.

More specifications...