The 3D profilometer µscan custom has proven itself many times over in the measurement of topography, height profile or layer thickness in production processes. Its modular construction allows adaptation to many different measurement tasks. The NanoFocus software concept means you are up to speed in the shortest time. From fully automatic generation of analysis protocol through to SPC evaluation, you obtain a “press button solution” specially tailored to your application. In addition, with the NanoFocus µscan series you measure up to 100 times faster than with conventional tactile systems. That saves money and reduces costs.
