Atomic force microscope Flex-Axiom
surface roughnessfor surface inspectionfor materials research

atomic force microscope
atomic force microscope
atomic force microscope
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Characteristics

Type
atomic force
Technical applications
surface roughness, for surface inspection, for materials research, biomedical, multipurpose
Configuration
benchtop
Other characteristics
modular, topography, for thermal analysis, for air/liquid use, ultra-high resolution
Resolution

Min.: 3 µm

Max.: 100 µm

Description

The most flexible atomic force microscope for materials research Most flexible scan head available Suitable for any sample size Modular concept: configure your FlexAFM to exactly match your needs For success in materials research studies, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand. By advancing key technologies and designs, Nanosurf has made the Flex-Axiom one of the most versatile and flexible AFMs ever, allowing a large variety of materials research applications to be handled with ease. In combination with the powerful C3000 controller, complex material characterizations are possible.

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.