New Dimensions in the Measurement of Thermal Diffusivity and Conductivity – Fast, Simple, Economical
Accurate thermal diffusivity and thermal conductivity measurements between RT and 1250°C with Xenon Flash
The LFA 467 HT HyperFlash® is based on the already-established LFA 467 HyperFlash® technology and requires no laser class due to the innovative light source system. The long lifetime of the xenon lamp provides cost-effective measurements until 1250°C without costly consumables.
ZoomOptics – For precise measurement results by an optimized field of view
The patented ZoomOptics system (patent no.: DE 10 2012 106 955 B4 2014.04.03) optimizes the field of view of the detector, thus eliminating any influences caused by aperture stops. The result is a significant increase in the precision of the measurement results.
Ultra-fast sampling rate (up to 2 MHz) and extremely short pulse widths (up to 20 µs) enabling measurement of thin and highly conducting materials
The data acquisition rate of the LFA 467 HyperFlash® series was increased to 2 MHz. This acquisition rate applies to both the IR detector and the pulse mapping channels. Thereby, highly conductive and/or thin materials requiring very short test times can be reliably tested.