New Wave Research

Electric tester
45000 | Model 3400 New Wave Research

Model 3400 Multi-Function Tester for MLCC chip arrays offers exceptional test flexibility and performance, with throughput up to 45,000 parts per hour.

The Model 3400 supports up to ten user-programmable test stations that can be factory configured with Cap/DF, Flash, IR PreCharge, IR PreSoak, High or Low Volt IR measurement, or Cross Check tests. Cap/DF tests are performed one element at a time, with all remaining elements connected to guard for the most accurate measurements.

The Cross Check test identifies arrays with internal leakage paths or external termination shorts.

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Patented rolling contacts

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Handles 0306 (0816 metric) to 0612
(1632 metric) chip sizes
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High throughput - up to 45,000 pph
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Lowest cost-to-test
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Ten user programmable test stations
with Cap/DF, Flash, high/low volt IR,
PreCharge, PreSoak and Cross Check
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Offers IR soak time > 1 second at
normal operating speed
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