X-ray inspection machine for circuit boards
160 kV, 60 W | XT V 160R
Nikon Metrology
The XT V 160R is a versatile microfocus X-ray analysis system for both manual and programmed inspection of samples that demand the highest level of contrast sensitivity.
The XT 160 R fitted with a reflection target X-ray source has been developed in direct response to customer requirements and primarily aims at the semiconductor packaging applications for package void inspection.
Key benefits
High contrast sensitivity
Low energy imaging capability
High resolution micron level features
Advanced ergonomics
Viewing from any angle
Low cost of ownership
The XT 160 R fitted with a reflection target X-ray source has been developed in direct response to customer requirements and primarily aims at the semiconductor packaging applications for package void inspection.
Key benefits
High contrast sensitivity
Low energy imaging capability
High resolution micron level features
Advanced ergonomics
Viewing from any angle
Low cost of ownership
