X-ray inspection machine with computed tomography (CT)
225 - 320 kV | XT H 225/320 LC Nikon Metrology

The XT H 225/320 LC features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects. Nikon Metrology is the only company to produce 320kV microfocus X-ray sources. As the X-ray spot size of these sources is orders of magnitude smaller compared to minifocus sources, end users benefit from superior resolution, accuracy and a wider array of measurable parts.

With the optional rotation reflection target, an even higher X-ray flux is available enabling customers to obtain faster CT data acquisition or achieve higher CT data accuracy in the same time span
Key benefits

Proprietary 225/320kV microfocus X-ray source
Run highly accurate inspection on dense industrial objects
Easy system operation and low cost-of-ownership
Stunning images providing great insight
High performance image acquisition and volume processing
Straightforward inspection automation
Safety first