Scanning electron microscope (SEM) OMICRON

The in-situ combination of STM, SEM and SAM for high resolution structural and chemical analysis creates a superior research tool. Atomic resolution STM is ideally complemented by the abilities of the SEM to image large surface areas, help to identify areas of interest, and finally assist the precise positioning of the STM tip to the desired spot on the surface.

The MULTISCAN LAB employs the goniometer mounted MULTISCAN STM as an ideal base for such dedicated experiments. The highly stable UHV chamber (30mm wall thickness) together with a rigid system frame and vibration isolation by a pneumatic auto-levelling damping system ensures both optimal STM and SEM performance.

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