Scanning probe microscope (SPM)
OMICRON
* Electrical Contacting of Nanodevices
* STM-Based Safe & Non-Destructive Tip Approach
* Full STM Capability
* High-Resolution, < 4 nm SEM Imaging for Rapid Tip Navigation
* High-Resolution, < 10 nm SAM Imaging for Chemical Mapping
* True UHV Operation for Clean & Artefact-Free Surfaces
A major challenge in nanotechnology is the incorporation of single nanodevices into large integrated circuits. Device technology research thus requires local electrical characterisation in combination with a probe navigation that bridges dimensions from the mm scale down to the nm scale.
The UHV NANOPROBE is a sophisticated analytical instrument specifically designed for local and non-destructive 4-point contact measurements and function testing of nanodevices within complex structures and integrated circuits. Omicron's proven SPM technology is the key to advancing probing technology into the nanometer scale. It ensures extremely accurate probe positioning and safe approach of fragile probe tips having diameters in the range of a few tens of nanometers or less.
