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Scanning tunneling microscope (STM)
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  • scanning tunneling microscope (STM) OMICRON
Increased complexity of today\'s applications requires high-resolution structural and chemical analysis of nanometer-scaled structures. The integral combination of different analysis technologies is the key to gain complementary information of the very same sample area.

This goal is ideally achieved with the goniometer-mounted MULTISCAN STM, integrated into the MULTISCAN LAB™ UHV system. To enable simultaneous and ultimate performance SEM/SAM/SPM operation, an extremely stable and compact SPM is utilised. The SPM stage is mounted onto a goniometer for optimal signal efficiency together with other detectors such as the NanoSAM analyser for ultimate SAM resolution or SEMPA (Scanning Electron Microscopy with Polarisation Analysis) and many others. The SPM can be operated under any rotation angle

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