Spectroscopic ellipsometry is a powerful tool for thin film metrology. omt implements this method in an easy-to-use system with an advanced modular optical and mechanical design mainly for industrial applications.
ellipsometry vs. reflectometry (TFA)
Reflectometry is often much simpler to perform than ellipsometry.
Reflectometry is in general less expensive than ellipsometry.
omts TFA does not use focusing optics allowing reflectometry to be insensitive to sample vibrations.
Measurements on moving samples are possible.
omts TFA measurement heads can be used in harsh environments.
In an industrial setting, a TFA can provide real-time feedback and QA.