Optikos' I-SITE™ electro-optical testing system can be used for many different types of measurements in different wavelength regions. Both electronic and optical signals can be evaluated. Measurements characteristic of infrared imaging systems such as minimum resolvable temperature difference (MRTD), minimum detectable temperature difference (MDTD), signal transfer function (SiTF), and noise equivalent temperature difference (NETD) are supported along with their visible analogs.
