Coating thickness analyzer Oxford Instruments Analytical
X-Strata980

X-Strata980 for analysis of trace elements and coating thickness

Combining a high power X-ray tube and high resolution detector, the X-Strata980 X-ray Fluorescence analyzer delivers limits of detection in single digit ppms!

Oxford Instruments offers a full range of instruments dedicated to the electronics manufacturing industry. Our XRF instruments are available in different configurations; for RoHS compliance screening and testing. Please contact us to find out about the wide variety of solutions offered.

Key Applications:
Trace analysis of hazardous substances
Solder alloy analysis
Coating thickness measurement of gold and palladium on electronics
Metal alloy chemistry identification
Coating thickness measurement on jewelry

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