Coating thickness measuring instrument Oxford Instruments Analytical
CMI900

CMI900 - For Measurement of Coating Thickness and Material Composition

CMI900 is a cost effective, high performance XRF analyser for measurement of coating thickness and material composition.

- Measure the thickness and/or composition of plating, coating, thin films
from Ti to U
- 5 layers / 15 elements / Common elements correction
- Composition analysis of up to 15 elements simultaneously
- Measurement method according to ISO 3497, ASTM B568 and DIN 50987

Applications:
- Multi-layer Metallic Coating Thickness Measurement
- Alloy Identification and Chemistry Analysis
- Plating solution analysis
- Gold karat assay

More specifications...