Coating thickness measuring instrument
50 W | CMI900
Oxford Instruments Analytical
High performance XRF spectrometer
- Fast and precise analysis: proportional counter detector and 50 watt micro-focus X-ray tube provide high sensitivity
- Simple element differentiation: secondary beam filters enable the spectral separation of overlapping elements
- Optimised performance across a wide range of elements: optimised, preset methods of parameters.
- CMI900 is supplied with over 800 pre-loaded application parameters/methods
Excellent long-term stability:
-Automatic thermal compensation measures the instrument temperature and corrects for changes, giving stable results
- Simple and rapid Spectrum Calibration routine checks the instrument performance (such as sensitivity) and applies necessary corrections
Rugged and robust design
- Operation in a lab or by the production line
- Sturdy, industrial design
- Field-proven technology, with over 3,000 instruments sold worldwide
Applications
- Multi-layer Metallic Coating Thickness Measurement
- Alloy Identification and Chemistry Analysis
- Plating solution analysis
- Gold karat assay
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