Coating thickness measuring instrument for conductive coatings
ASTM B244, ISO 2360 | CMI243
Oxford Instruments Analytical
The CMI243 package enables control of plating coating processes using advanced eddy-current technology. It provides non-destructive coating thickness measurement for conductive coatings over conductive substrates.
The system is specially designed to handle the needs of platers, coaters, and quality professionals. The standard package consists of a control unit, an ECP-m eddy current probe and a set of Zn on Steel NIST traceable calibration standards. The ECP-m probe is specifically tailored for metallic coatings on metallic substrates such as Zn on Steel.
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