X-ray fluorescence (XRF) coating thickness analyzer
A simple to use, quality control analyser for coating thickness and materials analysis.
New modern design
Rapid measurement (seconds) from one to four coating layers
Range of hardware configurations, i.e. Standard base, Minwell, or automated table to cover a wide range of sample types
“Slotted Chamber” to measure large area samples, e.g. printed circuit boards, flat sheets etc
Compliance with ISO3487 and ASTM B568 test methods