Atomic force microscope (AFM) Park Systems Inc

Affordable, Research-Grade AFM with Flexible Sample Handling

An economic extension of the XE-100, the XE-70 is Park Systems’ new AFM solution for budget conscious customers. Having a compact mechanical design, the XE-70 continues the innovative technology of the XE-series that sets it apart from conventional AFM. The XE-70 shares the same modes, options, and electronics as well as all other systems in the XE product line.

- Compact mechanical design
- 50 μm × 50 μm XY scan range
- 12 μm Z scan range
- Manual optics stage
- Complete new system with XE electronics

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