3D confocal microscope for topography
SurPhase HS®
PHASEVIEW
Roughness with Ra below 1nm or profiles up to 400 µm height can be measured in less than 1 second for 1M measurement points, with high accuracy and repeatability.
This new 3D optical instrument comes in a smart light weight packaging, and is totally insensitive to vibrations for use in any industrial environment. PhaseView offers both turnkey and OEM version to ease integration in automated inspections systems.








