Group: Scanning Electron Microscope (SEM)
Metallurgical sample holder for scanning electron microscopes (SEM)
This sample holder eliminates extra sample preparation of non-conductive resin-mounted samples. This way imaging samples becomes fast and trouble free.
Up to 8 times higher magnification before charging is visible, compared to the standard Phenom sample holder.
The need for sputter-coating is reduced dramatically, so no additional equipment is required and sample preparation is faster.
Non-conductive samples can be imaged in their natural state, providing valuable back scatter material contrast information.