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Metallurgical sample holder for scanning electron microscopes (SEMs)

This sample holder eliminates extra sample preparation of non-conductive resin-mounted samples. This way imaging samples becomes fast and trouble free.

Key Specifications
Up to 8 times higher magnification before charging is visible, compared to the standard Phenom sample holder.
The need for sputter-coating is reduced dramatically, so no additional equipment is required and sample preparation is faster.
Non-conductive samples can be imaged in their natural state, providing valuable back scatter material contrast information.


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