Scanning electron microscope (SEM) (3D, Ra, Rz)
3D, Ra, Rz
Phenom-World
G2 pro desktop scanning electron microscope (SEM) is able to generate 3D images and submicrometer roughness measurements.
This fully automated application for the Phenom G2 pro desktop SEM will help to communicate imaging results and will extract and visualize data normally hidden within a sample.
3D
3D imaging helps to interpret sample characteristics and makes images understandable for a larger group of users. It is often difficult, for example, to identify dents, scratches and burrs from flat 2D images.
Roughness
Measuring the average roughness (Ra) and the roughness height (Rz) is critical for controlling and understanding production processes. By using SEM imaging for data collection, a much better resolution can be achieved than by using traditional
(indirect) methods.
The 3D Roughness Reconstruction application is a desirable addition to the Phenom G2 pro when one or more of the following are required:
* Quality control in machining
* Texture analysis
* Evidence characterization
* Defect & failure analysis
* Wear analysis - tribology
The 3D Roughness Reconstruction application is available in the Phenom Pro Suite that contains multiple Phenom G2 pro specific applications.
Benefits of the 3D Roughness Reconstruction application:
* Outperforms optical and mechanical measurement systems:
- High resolution
- Insensitive for reflective samples
- Direct method
- Non-destructive
* Intuitive fully automated user interface
* Based on 'shape from shading' technology, no stage tilt required
* Integrated solution
* Fast reconstruction
* Retrofit onto Phenom G2 pro
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