Group: Scanning Electron Microscope (SEM)
Scanning electron microscope (SEM) (3D, Ra, Rz)
With the 3D Roughness Reconstruction application, the Phenom desktop SEM systems are able to generate three-dimensional images and submicrometer roughness measurements. This fully automated application for the Phenom desktop SEM helps to communicate imaging results and will extract and visualize data normally hidden within a sample.
3D imaging helps to interpret sample characteristics and makes images understandable for a larger group of users. It is often difficult, for example, to identify dents, scratches and burrs from flat 2D images. Measuring the average roughness (Ra) and the roughness height (Rz) is critical for controlling and understanding production processes. By using SEM imaging for data collection, a much better resolution can be achieved than by using traditional (indirect) methods.
Intuitive user interface, maximum employability
Intuitive fully automated user interface
Based on shape from shading technology, no stage tilt required