Near-field profiling is a common technique used to analyze small beams, and involves using a microscope objective lens to image the beam onto a camera detector array. This technique extends the measurement range of the profiler. Near-field profiling is performed in fiber and waveguide analysis, lens characterization, and other applications where beams 50 microns or smaller are analyzed. Photon offers near-field profilers using either camera-based beam profilers or scanning slit profilers.
