Piezo microscope nano-focus system sub-nm precision, sub-msec response Physik Instrumente

- Piezo Z-stage Design
- Scans and Positions Objectives with Sub-nm Resolution
- High Linearity and Stability with Direct-Measuring Capacitive Sensors
- Travel to 460 µm, Fast Response & Settling Time
- Frictionless Precision Flexure Guiding System
- Enhanced Guiding Precision for Better Focus Stability
- Ask about DIC Prism Holder Option
- Controller Compatible with Metamorph™ Imaging Software
- Quick Lock Adapter for Easy Attachment

P-725 PIFOCs® piezo Z-stages are long-travel, high-speed, piezo-driven microscope objective nanofocusing/scanning devices.
Despite the increased travel ranges (up to 460 µm), they are 20% shorter than P-721 units (see page see link), while providing sub-nanometer resolution. Equipped with ultra-precise, direct-measuring capacitive sensors, these devices are ideal for tasks such as surface metrology or deconvolution microscopy (Z-stack acquisition). The newly designed, frictionless, flexure guiding system provides enhanced precision for superior focus stability with fast response for rapid settling and scanning.

P-725 PIFOCs® are mounted between the turret and the objective, extending the optical path by only 12.5 mm (infini-ty corrected microscope re-quired; extension tubes are available to adjust path lengths of other objectives on the turret). Custom designs for positioning the complete turret are available on request.

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