Piezo scanner for AFM, SPM microscopy, sub-nm linearity
Ultra-High-Performance Closed-Loop Professional scanner for AFM/SPM
Compact Manipulation Tool for Nanotechnology
Resonant Frequency 9.8 kHz
Ultra-High-Precision Capacitive Feedback
Parallel-Motion Metrology for Highest Linearity and Stability
50 Picometers Resolution
5 x 5 x 5 µm Travel Range
Very Small Package
Rugged Design
