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Bench-top oscilloscope PicoScope 9300 series
digitalopticaldifferential

bench-top oscilloscope
bench-top oscilloscope
bench-top oscilloscope
bench-top oscilloscope
bench-top oscilloscope
bench-top oscilloscope
bench-top oscilloscope
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Characteristics

Input signal
digital, differential, optical
Portability
bench-top, portable
Number of channels
2-channel, 4-channel
Options and accessories
USB, compact, for PC
Bandwidth

15 GHz, 20 GHz, 25 GHz

Description

Sampling Oscilloscopes to 25 GHz with TDR/TDT and Optical models 15 to 25 GHz electrical, 9.5 GHz optical, TDR/TDT, 2-channel and 4-channel, compact, portable, USB instruments. These units occupy very little space on your workbench and are small enough to carry with your laptop for on-site testing, but that’s not all. Instead of using remote probe heads attached to a large bench-top unit, you can position the scope right next to the device under test. Now all that lies between your scope and the DUT is a short, low-loss coaxial cable. Everything you need is built into the oscilloscope, with no expensive hardware or software add-ons to worry about. • 15 TS/s (64 fs) sequential sampling • Up to 15 GHz prescaled, 2.5 GHz direct trigger and 11.3 Gb/s clock recovery • Industry-leading 16-bit 1 MS/s ADC and 60 dB dynamic range • Eye and mask testing to 16 Gb/s with up to 223–1 pattern lock • Intuitive, touch-compatible Windows user interface • Comprehensive built-in measurements, histogramming and editable data mask library • Integrated, differential, deskewable TDR/TDT step generator Typical applications • Telecom and radar test, service and manufacturing • Optical fiber, transceiver and laser testing • RF, microwave and gigabit digital system measurements • Radar bands I, G, P, L, S, C, X, Ku • Precision timing and phase analysis • Digital system design and characterization • Eye diagram, mask and limits test to 10 Gb/s • Ethernet, HDMI 1, HDMI 2, PCI, SATA, USB 2.0, USB 3.0 • TDR/TDT analysis of cables, connectors, backplanes, PCBs and networks • Optical fiber, transceiver and laser test • Semiconductor characterization

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