Time-resolved photoluminescence (TRPL) analyser for semiconductor wafers
WaferCheck 150 PicoQuant

The WaferCheck 150 system is a complete and easy to use system for Time-Resolved Photoluminescence (TRPL) measurements. TRPL is a very powerful tool for the contact-free characterization and investigation of semiconductor materials. It is non-destructive and involves only light as a probe. It can be used for everything from raw materials to in-process intermediates to finished devices. These capabilities qualify TRPL as a valuable analysis tool for research, testing and quality control.

The application of TRPL in the semiconductor industry is focused mainly on the measurement and identification of electron-hole recombination rates. The length of time a photo-excited carrier can remain in the conduction (or valence) band is an important parameter directly related to material quality and device performance. The fluorescence lifetime decay value is an indicator for characterizing semiconductor materials for use in e.g. photovoltaic devices (solar cells), photodetectors, LEDs, etc.