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Analysis microscope SAM 400
for researchhigh-speedscanning acoustic

analysis microscope
analysis microscope
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Characteristics

Technical applications
for analysis, for research
Other characteristics
high-speed, scanning acoustic, for semiconductors

Description

The SAM 400 is a high-performance tool enabling non destructive acoustic investigations for dedicated high throughput analysis, quality control and research applications. It features a new high speed maintenance free stage and new rf and transducer technologies of up to 400 MHz, controlled through a user friendly graphical interface. Built to semiconductor industry standards around a core platform that utilizes the latest production and research technology, the SAM 400 can accurately handle wafers up to 300 mm and samples up to 660x860x60 mm (w/l/h). Ultrasound frequencies range up to 500 MHz with transducers from 10 MHz - 400 MHz. Different tank sizes and trays are available. Scanning range: x=250 µm-430 mm, y=250 µm-430 mm, z=100mm
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.