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Wafer microscope SAM 300 AUTO WAFERinspectionautomatedscanning acoustic
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Characteristics
- Technical applications
- inspection
- Other characteristics
- automated, scanning acoustic, for wafers
Description
The SAM 300 AUTO WAFER is a product line developed for in line production control of bonded wafers. Its is compatible with clean room class 10.
The main application is detection of voids, inclusions and delaminated areas at the bonded interface of wafers.
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.