Laser diode test system Qmax Test Technologies

- Designed as an Ultra Fast Open / Short / Diode Drop tester for semi-con industry, where production testing of high pin count devices are involved and test time is critical.
- High speed testing at 2 seconds for 2 million test combinations.
- Can be interfaced to any type of test fixtures
- Multi-Site Test support for Strip or Multiple device test.
- 16 Opto Isolated digital outputs for handler interface, binning and PASS FAIL indicators.
- 16 Opto Isolated Digital Inputs for Operator console and handler interface.
- Opto Isolated Digital I/Os are fully programmable for timing compliance of various handlers.
- Fast turnaround time to test new products.

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