QT1100 can functionally test any device working at 5V in in-circuit as well as out-circuit using library defined test patterns. The Visual WorkStation (VWS) mode allows interactive testing of individual devices, as well as wholeboard test. The Device Under Test (DUT) is tested under actual in-circuit conditions, that are available on the board. QT1100 uses the back-driving or node-forcing technique to functionally test devices in-circuit. The back-driving current is limited to 220 mA and back-driving time is limited to 65 m.secs. to comply with the International Defence Standards 00-53/1.
1. In-Circuit Digital Functional Testing
2. Auto compensation with Qmax Simulator
3. Board Learn & Board Test Modes
4. QSM VI – an advanced tool for failure analysis
5. Auto Guarding
6. Logic Analyser
7. Circuit Tracing
8. Developing New Device Program
9. Short Locator
10. RCV Measurement & Oscilloscope
