light source characterization goniometer / for light measurement / for light source analysis / for spatial light distribution
Radiant Vision Systems
for light source characterization, for light measurement, for light source analysis, for spatial light distribution, with EULUMDAT files generation, with IES file generation, with radiant source model generation
Comprehensive view angle performance characterization system for large light sources
PM-NFMS (ProMetric Near-Field Measurement System) measures brightness, color, and, optionally, spectrum as a function of viewing angle for large light sources. It is designed to provide accurate luminance distribution data for developers of large light sources for automotive, transportation, architectural, and other applications. Because PM-NFMS captures a complete near-field model of the light source, it provides much more comprehensive information - in a much smaller measurement space - than can be obtained from traditional spot meter-based measurements.
PM-NFMS generates illumination distribution data in multiple standard formats
By processing the measured data, PM-NFMS can output IES format files, EULUMDAT files, illuminance distribution on a plane as table, and Radiant Source Model™ (RSM) files. The RSM files can be used to generate either photopic, colorimetric or spectral ray sets for use in optical design tools by using ProSource® Software.
Extensive analysis functions provide complete view angle performance analysis as well as extrapolation as an illumination distribution.
The PM-NFMS system software supports light source performance analysis through an extensive variety of quantitative analyses, including isoplots, CIE color analyses and radar plots. In addition, the PM-NFMS software can be used to extrapolate a far-field illumination distribution from the measured near-field RSM. This results in a substantial reduction in the space required to perform these measurements when compared to spotmeter-based methods where the measurement instrument must be place in the far field.