Atomic force microscope / measurement / digital camera / Raman
SPM/AFM RENISHAW

Characteristics

  • Type:

    atomic force

  • Technical applications:

    measurement

  • Other characteristics:

    digital camera, Raman

Description

The Renishaw inVia Raman microscope is a remarkably flexible device which can be directly connected to a vast range of SPMs and AFMs, and those made by Nanonics Imaging Ltd, Bruker Nano Surfaces, JPK, Park and NT-MDT included. It lets you select an AFM fit for the needs of your application area.

These combined systems can be utilized to handle near-field measurements such as SNOM and NSOM, as well as to gather Tip Enhanced Raman Spectroscopy (TERS). Integrated Raman AFM measurements permit the characterization and investigation of structural and chemical properties of materials at sub-micrometer scales.

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