Non-destructive material testing device
SIS XP
ROLAND ELECTRONIC
* PC-Platform under Windows XP®
* Sensor array with 16 sensors
* High fault detection capability with documentation
* Magnetic functional principle
* Central analysis and operating
* Visualisation of sensor signals
* Galvanically isolated signal outputs for connection to PLC
* Sensor array with 16 sensors
* High fault detection capability with documentation
* Magnetic functional principle
* Central analysis and operating
* Visualisation of sensor signals
* Galvanically isolated signal outputs for connection to PLC
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