Nitrogen analyzer DF-750

oxygenhydrogenmonitoring

The DF-750 is the leading choice in moisture analysis for the semiconductor industry The DF-750 is a trace/ultra-trace moisture analyzer optimized for measurements in the ultra-high-purity (UHP) gases used in 300mm semiconductor fabs. High stability TDL trace/ultra-trace measurements A no-compromise solution Simple maintenance and reduced ongoing costs Designed specifically to make trace and ultra-trace moisture measurements in a range of UHP gases, the DF-750 is optimized for 300mm semiconductor fabs. It measures moisture as a contaminant in the electronics grade gases nitrogen, hydrogen, helium, argon and oxygen. Tunable Diode Laser (TDL) sensing technology delivers an industry-leading 100 parts-per-trillion (ppt) Lower Detection Limit (LDL), ensuring the DF-750’s stable, highly accurate measurements meet the precise monitoring needs of semiconductor production. The robust DF-750 has low lifetime maintenance requirements and delivers zero-drift stability, greatly extending calibration intervals. This low cost- of-ownership combined with exceptional measurement performance means that the DF-750 is the first-choice analytical solution for UHP gas quality checks. High stability TDL trace/ultra-trace measurements The DF-750 is designed to meet the exceptional gas purity standards demanded by semiconductor manufacturers worldwide. Utilizing leading-edge TDL sensing technology, housed in a robust and resilient Herriot Cell, the DF-750 avoids moisture contact with optical sensing components. The result is an analyzer that delivers an ultra-sensitive