Energy dispersive X-ray fluorescence (EDXRF) spectrometer Skyray Instrument

Features:

EDX 2800 is specially designed for RoHS substance detection (Cd, Pb, Cr, Hg, Br) and full elements analysis, jewelry analysis and plating thickness measurement.

Specifications:

Content ration range: 0.01%---99.99%
Measurement time: 60---300 seconds
Accuracy: 1ppm for RoHS directive test. (for samples whose contents are more than 96%)
Energy revolution: 165+-5eV
Measurement substance: solid, powder and liquid
Test Range: 75 elements from sulfur to uranium
Detect source: Electro-refrigeration SI-PIN semiconductor detector
Power supply: AC 110/220V+-5V
Relative humidity: ¡Ü 70£¥
Weight: 130lb

Configuration:

Single sample chamber: 24*16*4In
Signal-to-Noise Enhancer (SNE) provides powerful assurance for measurement accuracy
Electro-refrigeration SI-PIN semiconductor detector is more convenient than liquid nitrogen refrigeration.
Switch collimators and filters automatically for different samples
High voltage power supply: Tube voltage (Max): 50kV; Tube current (Max): 1mA
X-ray tube: Tungsten target material
X-ray Optical System: Bottom Optical system
CCD Camera: 1.4 million pixels CCD camera
Applicable software: RoHS analysis software
(applicable to Windows 2000 and Windows XP operation systems)
Collimator: ¦µ8, ¦µ6, ¦µ4, ¦µ3, ¦µ2, ¦µ1, ¦µ0.5, ¦µ0.1mm

Safety

The instrument has double shield covers and the outer cover has lead sheet which can prevent Xray from leaking
The shield cover of the instrument has interlocks with high voltage of X-tube. When the cover is open, the X-ray tube is shut down automatically to prevent X ray from leaking.