Energy dispersive X-ray fluorescence (EDXRF) spectrometer Skyray Instrument
Au

Features:
EDX 600 is specially designed for Jewelry analysis, such as Au Ag Cu. It can also measure plating thickness.

Specifications:
Content ration range: 0.1%---99.99%
Measurement time: 60---300 seconds
Accuracy: 0.1% ( for samples whose contents are more than 96%)
Precision of plating thickness: 10-50nm
Measurement substance: solid, powder and liquid
Metals Range: Au Ag Cu
Weight: 70lb
Detect source: proportional counter
Power: 50W
Relative humidity: ¡Ü70£¥

Configurations:
Single sample chamber: 12X12X8In
Adopt closed proportional counter as detector
Preamplifier and main amplifier circuits
High voltage power supply: Tube voltage (Max): 50kV; Tube current (Max): 1mA
X-ray tube: Tungsten target material
X-ray Optical System: Bottom Optical system
CCD Camera: 1.4 million pixels CCD camera
Applicable software: Precious metal analysis software
Collimator: ¦µ3mm