Micro X-Ray Fluorescence (XRF) spectrometer for point analysis, line-scan, and mapping SPECTRO MIDEX M
The SPECTRO MIDEX M is a multi-purpose X-ray micro fluorescence analysis (XRMF) system for non-destructive analysis of very small samples in solid or liquid form. It is especially suitable for point analysis, line scan, and mapping.
For determining the exact measurement position in the spaciously dimensioned sample chamber, there is an integrated double video system with different magnifications. On the samples, lines or surface areas can be defined and then traversed and analyzed. The software enables individual measurement points to be evaluated and the distribution of elements to be illustrated graphically within a previously defined sample range.
