TME Electronics

Differential pressure decay leak tester
Solution C-BC TME Electronics

The TME Solution-C-BC Blister Card Test System produces quantitative results in non-destructive, pressure or vacuum decay leak testing of blister cards. The test instrument provides all the features of the high-resolution, technologically advanced TME Solution-C test instrument, and the customized test chambers accommodate your specific product. Interchangeable fixture inserts can be provided to accommodate a variety of sizes and shapes, and a gross leak detector is built in to detect open or broken seals.
  • zoom



Exhibitor's categories
standListOtherProduct www di En 2012-06-22-03