Inspection machine for semi conductor MX100IR
Viscom
For semiconductor assemblies, the requirement for a precise, thorough inspection for damage and defects during the production process is especially high. Wafers need non-destructive inspection of surface purity and evenness. Inspection for defects beneath the surface is also especially important, as is measurement of dies and sealing adhesive on MEM components (e. g. sensors). The Viscom MX100IR takes on these tasks. One especially important application area is the 100 % inspection of safety-critical components.
