X-ray inspection machine with computed tomography (CT)
X8011CT
Viscom
Application area
New, multilayered technologies and increasing miniaturization require inspection solutions which make concealed and ever-smaller structures visible. The X-ray inspection system X8011CT with integrated computed technology makes possible perpendicular slices and delivers conclusions about the type, geometry and position of material defects in, for example, cast and ceramic parts as well as electronic assemblies.
Highlights
* Fast, user-friendly computed tomography
* Modular, low-maintenance microfocus X-ray tube
* EasyClick principle for simple installation of the handling units
* 3-axis manipulation system can be extended to 6 axes
* First-class image quality through optional flat image detector
* Direct structure measurement in real units
* CNC capability in all axes
* Test piece positioning in optical overview image
* Analysis software for BGAs, wire sweep and surface defects
* Non-destructive slices and complete volume reconstruction
* Better defect localization through spatial visualization
New, multilayered technologies and increasing miniaturization require inspection solutions which make concealed and ever-smaller structures visible. The X-ray inspection system X8011CT with integrated computed technology makes possible perpendicular slices and delivers conclusions about the type, geometry and position of material defects in, for example, cast and ceramic parts as well as electronic assemblies.
Highlights
* Fast, user-friendly computed tomography
* Modular, low-maintenance microfocus X-ray tube
* EasyClick principle for simple installation of the handling units
* 3-axis manipulation system can be extended to 6 axes
* First-class image quality through optional flat image detector
* Direct structure measurement in real units
* CNC capability in all axes
* Test piece positioning in optical overview image
* Analysis software for BGAs, wire sweep and surface defects
* Non-destructive slices and complete volume reconstruction
* Better defect localization through spatial visualization
