This system is purpose built for volume inspection in a production environment, either in semiconductor packaging or PCB assembly. With a sample scan area of up to 350 x 530mm, the cabinet can accommodate large samples or trays of components. The HAWK has the same self-contained design and shelving as the COMPACT, however it is available with a wider range of source and imaging configuration to suit specific applications. 2 or 5 µm Focal Spot Transmission Target X-Ray Source, 25 to 160 kV, 0 to 500 µA (non continuous) 10 Watt (5µm) or 20 Watt (2µm). 5kg Capacity 3 axis fully programmable manipulator, 2kg capacity Tilt and Rotate. Attachment gives 5 fully programmable axes. Maximum scan area 350 x 530mm (310 x 500mm with Tilt and Rotate Attachment) Geometric Magnification up to: 2400x. System Magnification up to: 5000x. Feature recognition: down to 1 micron. External Cabinet Dimensions: 1060mm L, 1350mm D, 1955mm H. Full system control and image processing software. Common Applications include: Semiconductor packages, PCB assembly inspection.