Test system for telecommunications devices
250 kHz - 3 GHz | TS6900S YOKOGAWA Europe

The TS6900S is an RF mixed IC test system that improves measurement throughput and reduces the cost of RF chipsets for mobile communication consoles such as 3.5-generation mobile phones, One-Seg mobile phones, WiMAX, and the like.

Features & Performance
Equipped with an RF signal generator and measuring circuit developed specifically for this test system
Wide-band waveform generator, digitizer
Flexible DSP computation
Capable of testing A/D mixed devices

Target devices:
RF transceiver such as cellular phones, GPS, One-Seg mobile phones, mobile WiMAX, lowpower wireless and the like.
Main specifications:

RF Source (SHFS)
Number of channels: 2
Frequency range: 250 kHz to 3 GHz
Output level:-110 dBm to +10 dBm
SSB phase noise: -124 dBc/Hz typ.(at 2GHz, 20 kHz offset)

RF Measurement (SHFM)
Number of channels: 1
Frequency range: 100 Hz to 3 GHz
Measurement range:-20 to +20 dBm(10 dB step)
Resolution bandwidth (RBW):1 Hz, 3 Hz to 1 MHz, 3 MHz,10 MHz(1-3 step)
Test example:
Gain /Carrier leak /IIP2,IIP3,OIP3
/Linearity Isolation /IQ phase amplitude error, error /ACLR,EVM /Spurious /CN
/BER