Non-contact surface profilometer
NewView™ 7100
Zygo
The NewView™ 7100 white light interferometer provides affordable versatility in non-contact surface profiling. With powerful tools for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with excellent precision and accuracy, all measurements are nondestructive, fast, and require no sample preparation. Profile heights ranging from < 1 nm up to 20000 µm, at high speeds, independent of surface texture, magnification, or feature height!
Using ZYGO's patented scanning white light interferometry (SWLI) technology, the NewView™ 7100 3D optical surface profiler easily measures a wide range of surfaces, including smooth, rough, flat, sloped, and stepped surfaces.
Using ZYGO's patented scanning white light interferometry (SWLI) technology, the NewView™ 7100 3D optical surface profiler easily measures a wide range of surfaces, including smooth, rough, flat, sloped, and stepped surfaces.
