{{#pushedProductsPlacement4.length}} {{#each pushedProductsPlacement4}}
{{product.defLight}}
{{#if company.requestButtonsVisibility.requestButtonQuestion == "ACTIVE"}}
{{elseif company.requestButtonsVisibility.requestButtonWhereToBuy == "ACTIVE"}}
{{/if}}
{{product.productLabel}}
{{product.model}}

{{#each product.specData:i}} {{name}}: {{value}} {{#i!=(product.specData.length-1)}}
{{/end}} {{/each}}

{{{product.idpText}}}

{{productPushLabel}}
{{#if product.newProduct}}
{{/if}} {{#if product.hasVideo}}
{{/if}}
{{/each}} {{/pushedProductsPlacement4.length}}
{{#pushedProductsPlacement5.length}} {{#each pushedProductsPlacement5}}
{{product.defLight}}
{{#if company.requestButtonsVisibility.requestButtonQuestion == "ACTIVE"}}
{{elseif company.requestButtonsVisibility.requestButtonWhereToBuy == "ACTIVE"}}
{{/if}}
{{product.productLabel}}
{{product.model}}

{{#each product.specData:i}} {{name}}: {{value}} {{#i!=(product.specData.length-1)}}
{{/end}} {{/each}}

{{{product.idpText}}}

{{productPushLabel}}
{{#if product.newProduct}}
{{/if}} {{#if product.hasVideo}}
{{/if}}
{{/each}} {{/pushedProductsPlacement5.length}}
analysis microscope / scanning electron / high-resolution / simultaneous acquisition
analysis microscope
SU7000

... FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous ...

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Hitachi High-Technologies Europe
analysis microscope / STEM
analysis microscope
HF5000

Hitachi's unique 200 kV aberration-corrected TEM/STEM: the perfect harmony of imaging resolution and analytical performance 0.078 nm spatial resolution in STEM is achieved together with high specimen-tilt capability ...

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Hitachi High-Technologies Europe
analysis microscope / scanning electron / nano-focus
analysis microscope
NP6800

The Hitachi NP6800 is a SEM-based dedicated probing system designed to meet the analytical needs of the 10-nm design node semiconductor device and beyond. The precision piezoelectric-driven actuator is equipped with ...

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Hitachi High-Technologies Europe
analysis microscope / scanning electron with focused ion probe / high-resolution
analysis microscope
NX5000

Unsurpassed Performance with Ultimate Flexibility The Hitachi Ethos FIB-SEM incorporates the latest-generation FE-SEM with superb beam brightness and stability. Ethos delivers high-resolution imaging at low voltages combined with ion ...

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Hitachi High-Technologies Europe
analysis microscope / electron / high-resolution / ultra-high resolution
analysis microscope
Regulus series

Resolution: 0.7 nm - 1,100,000 nm
Magnification: 20 unit - 2,000,000 unit

As a new brand of FE-SEMs, the Regulus series lineup comprises four models: the Regulus8100, Regulus8220, Regulus8230, and Regulus8240, all of which extend the functions of the SU8200 series with the use of a common platform. With optimized ...

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Hitachi High-Technologies Europe
analysis microscope / scanning electron / 3D / computerized
analysis microscope
SU5000

Resolution: 2 nm

Innovative analytical FE-SEM allows for a simple transition between high vacuum and variable pressure mode. EM Wizard is a knowledge-based system for SEM imaging that goes beyond basic preset conditions ...

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Hitachi High-Technologies Europe
analysis microscope / scanning electron / digital camera / variable pressure scanning
analysis microscope
S-3700N

Resolution: 3 nm - 10 nm

... superior analytical analysis. Capable of accommodating a 300-mm diameter sample with a maximum height of 110 mm. A 5-axis motorized stage makes the large chamber ideal for a wide variety of samples. Overview The ...

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Hitachi High-Technologies Europe
analysis microscope / measuring / SEM / compact
analysis microscope
TM4000, TM4000Plus

... innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized ...

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Hitachi High-Technologies Europe
analysis microscope / STEM / digital camera / for holography
analysis microscope
HF-3300

Resolution: 0.078, 0.102 nm

... 300 kV accelerating voltage. Unique analytical capabilities The newly introduced spatially resolved EELS* and the in-situ SEM/TEM imaging* nanobeam electron diffraction provide sophisticated and unique analytical ...

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Hitachi High-Technologies Europe
analysis microscope / atomic force / high-resolution
analysis microscope
H-9500

Resolution: 0.1, 0.18 nm
Magnification: 1,000 unit - 1,500,000 unit

The H-9500 is a 100-300 kV TEM with LaB6 electron gun. This is a user-friendly workhorse for atmoic-resolution TEM imaging and routine structural characterization. The excellent imaging capability also makes the H-9500 a platform for ...

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Hitachi High-Technologies Europe