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{{name}}: {{value}}
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{{name}}: {{value}}
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{{/end}}
{{/each}}
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Resolution: 0.08 nm - 0.23 nm
JEM-ARM200F is an Atomic Resolution Analytical Electron Microscope that includes the world's highest level STEM-HAADF resolution of 78 pm in conjunction with a STEM Cs corrector incorporated as standard. It offers the ...
Jeol

Resolution: 0.1 nm - 0.26 nm
... emission electron microscope that features an in-column energy filter that is made within the system of imaging lens, enabling the magnification range to be almost similar to those attained ones which contain conventional ...
Jeol

Resolution: 0.1 nm - 0.31 nm
The JEM 2200FS by Jeol, which is a state of the art analytical electron microscope, comes with a 200 kV FEG or field emission gun and the omega in column energy filter that permits a zero loss image where the inelastic ...
Jeol

Resolution: 0.14 nm - 0.31 nm
The JEM-2100Plus is a multi purpose transmission electron microscope, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation. Achieving superior performance through ...
Jeol

Resolution: 3, 1.2, 0.8 nm
Magnification: 25 unit - 1,000,000 unit
The next generation of high-resolution SEM is achieved by using the newly-developed Super Hybrid Lens (SHL) without the need for sacrificing any operability. Stable analysis is delivered with a large probe current by ...
Jeol

Resolution: 1, 1.3, 3 nm
Magnification: 25 unit - 1,000,000 unit
The Schottky Field Emission Scanning Electron Microscope model JSM-7610F manufactured by JEOL features a high power optics enabling an effective throughput and quality performance that is attributed by the aperture angle ...
Jeol

Resolution: 1.4, 1 nm
Magnification: 25 unit - 1,000,000 unit
The JSM-7500F Field Emission Scanning Electron Microscope is designed for versatility and high resolutions. Built with an optical system, this device can change the electron beam, even if accelerating voltages are low. ...
Jeol

Magnification: 10 unit - 60,000 unit
Benchtop Scanning Electron Microscope. Features intuitive operation that is achieved through the use of a touch panel and new operation screens. Included in the standard configuration is the low vacuum mode, EDS is also ...
Jeol