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analysis microscope / scanning electron / high-resolution
analysis microscope
JSM-IT500HR

... with its high-brightness electron gun system, provides amazing high-resolution imaging along with high sensitivity and high spatial resolution analysis ...

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analysis microscope / SEM / high-resolution
analysis microscope
JIB-4700F

Resolution: 1.2, 1.6 nm

... For the FIB column, a high-current density Ga ion beam of up to 90nA maximum probe-current is employed for fast ion milling and processing of specimens. Concurrent with high-speed cross-section processing ...

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laboratory microscope / scanning transmission electron / floor-standing / high-resolution
laboratory microscope
JEM-ARM300F

Resolution: 0.058, 0.063 nm

JEM-ARM300F GRAND ARM is an Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented ...

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analysis microscope / transmission electron / dark field / bright field
analysis microscope
JEM-F200

Resolution: 0.23, 0.19 nm

JEM-F200 is a new field emission transmission electron microscope, which features higher spatial resolution and analytical performance, an easy to use new operation system for multi-purpose operation, ...

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analysis microscope / scanning electron / high-resolution / high-speed
analysis microscope
JSM-7800F Prime

Resolution: 0.7, 3 nm
Magnification: 25 unit - 1,000,000 unit

... possible to perform high resolution observation as well as high-speed element mapping and EBSD on the nano-scale, while maintaining the smallest objective aperture. Surface observation ...

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analysis microscope / scanning electron / high-resolution / digital camera
analysis microscope
JSM-7800F

Resolution: 3, 1.2, 0.8 nm
Magnification: 25 unit - 1,000,000 unit

The next generation of high-resolution SEM is achieved by using the newly-developed Super Hybrid Lens (SHL) without the need for sacrificing any operability. Stable analysis is delivered ...

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analysis microscope / scanning electron / digital camera / high-resolution
analysis microscope
JSM-7500F

Resolution: 1.4, 1 nm
Magnification: 25 unit - 1,000,000 unit

The JSM-7500F Field Emission Scanning Electron Microscope is designed for versatility and high resolutions. Built with an optical system, this device can change the electron beam, even ...

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analysis microscope / scanning electron / high-resolution
analysis microscope
JSM-7200F

Resolution: 3, 1.6, 1 nm
Magnification: 10 unit - 1,000,000 unit

... above mentioned features. Thus, JSM-7200F is a next-generation multi-purpose FE-SEM that has capability of high resolution observation, high throughput analysis, ease ...

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