OverviewThe CTSHL Series from California Instruments (AMETEK Programmable Power) is an IEC-compliant harmonics and flicker test system designed for high-power AC/DC test applications. It provides laboratories and manufacturers with a complete, auditable solution for verifying compliance to harmonics, flicker and related low-frequency immunity standards.
Complete Test Solution / Conducted Emissions Testing- IEC 61000-3-2
- IEC 61000-3-3
- IEC 61000-3-11
- IEC 61000-3-12
Supported Test Standards- IEC 61000-3-2:2018+AMD1:2020 CSV — Limits for harmonic current emissions (equipment ≤316 A per phase) — Edition 5.1
- IEC 61000-3-3:2013+AMD1:2017+AMD2:2021 CSV — Limitation of voltage changes, voltage fluctuations and flicker (equipment ≤316 A per phase) — Edition 3.2
- IEC 61000-3-11:2017 RLV — Limitation of voltage changes, voltage fluctuations and flicker (equipment ≤275 A per phase) — Edition 2.0
- IEC 61000-3-12:2011+AMD1:2021 CSV — Limits for harmonic current emissions (equipment ≤316 A per phase) — Edition 2.1
- IEC 61000-4-11:2020 RLV — Voltage dips, short interruptions and voltage variations immunity tests (equipment ≤316 A per phase) — Edition 3.0 (pre-compliance)
- IEC 61000-4-13:2002+AMD1:2009+AMD2:2015 CSV — Harmonics and interharmonics including mains signalling at a.c. power port — Edition 1.2
- IEC 61000-4-14:1999+AMD1:2001+AMD2:2009 CSV — Voltage fluctuation immunity test for equipment with input current not exceeding 16 A per phase — Edition 1.2
- IEC 61000-4-17:1999+AMD1:2001+AMD2:2008 CSV — Ripple on d.c. input power port immunity test — Edition 1.2
- IEC 61000-4-28:1999+AMD1:2001+AMD2:2009 CSV — Variation of power frequency immunity test for equipment with input current not exceeding 16 A per phase — Edition 1.2
- IEC 61000-4-29:2000 — Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests — Edition 1.0 (pre-compliance)
Key Features of the CTSHL Series- Direct PC-bus DAQ for IEC 61000-4-7 compliant sampling and high-speed streaming to disk for audit-quality records.
- PC-based Harmonic and Flicker test software with real-time color displays and continuous PASS/FAIL monitoring.
- Automatic calculation of maximum permissible system impedance (Zsys) using Zref and measured flicker parameters per EN/IEC 61000-3-11.
- Intuitive test setup, data analysis and reporting with export to PDF and MS Word formats.
- High-resolution, gapless acquisition for replay and detailed post-test analysis (ASCII export available).
- Single-step and fast playback modes for reviewing test results.
AC Power SourceThe CTSHL configuration requires a Sequoia or Tahoe Series AC/DC source. These AC sources provide high current capability (up to 125 ARMS per phase) and advanced arbitrary waveform generation, precision measurements and waveform analysis. CTSHL is supplied as a configuration/option for these AC sources.
High-Speed Direct PC Data AcquisitionDSP-based data acquisition provides IEC-compliant sampling and direct PC-bus streaming. A signal conditioning and isolation unit (PACS-3-75) interfaces the AC source to the equipment under test (EUT), providing isolation, conditioning and anti-alias filtering. The EUT connects via a rear-panel terminal block.
Comprehensive Harmonics AnalyzerIncludes an IEC-compliant power analyzer for detailed voltage and current measurements. Harmonics and inter-harmonics are measured continuously with no gaps to meet IEC 61000-4-7; monitoring includes pass/fail detection against IEC class limits with results stored in a password-protected database.
IEC-Compliant Flicker Reference ImpedanceIEC 60725-compliant reference impedances are available: OMNI-3-75 (75 A RMS per phase) in a 43" cabinet for IEC 61000-3-11 and OMNI-3-37 for IEC 61000-3-3 (<16 ARMS). Quick-connect scheme allows switching between impedances.
Compliant Flicker MeterAn IEC 60868-compliant flicker meter (PACS) with DSP is integrated into the cabinet-mounted system.
Included in CTSHL Configuration- PACS-3-75 measurement system mounted in OMNI-3-75 cabinet
- OMNI-3-37MX three-phase lumped impedance for IEC 61000-3-3 flicker
- OMNI-3-75 three-phase lumped impedance cabinet for IEC 61000-3-11 flicker
- CIC652 CTSL software for IEC 61000-3-2 and IEC 61000-3-3 (P/N CIC652)
- CIC651 CTSH software for IEC 61000-3-12 and IEC 61000-3-11 (P/N CIC651)
- Rackmount PC with integrated PCIe DAQ card
- Rackmount console with integrated keyboard and monitor
PC Requirements- CPU: Pentium 4, 1.2 GHz or faster
- RAM: 256 MB or more
- Hard Disk: 20 GB or more (20 MB required for program storage)
- Display: Color SVGA monitor
- Slots: Available PCI slot for A/D card
- Software: MS Word, Windows
- IEEE-488: National Instruments IEEE controller and available PC slot or RS232 for power source control
Other Relevant AC Source Options- EN/IEC 61000-4-11 Voltage Dips and Interruptions option (pre-compliance)
- EN/IEC 61000-4-13 Harmonics and Inter-Harmonics option
PC Options and Accessories- CIC-PC: Pentium-class PC with preinstalled CTS and MXGUI (case, keyboard, mouse, Windows and MS Word)
- CIC-PCX: Adds 15" monitor and printer to CIC-PC
- CI400PCI: Spare PCI A/D card
- CI68C: Spare 37-pin signal interface cable for PCI
Technical Specifications- Product family / model: CTSHL Series
- Manufacturer / brand: California Instruments (AMETEK Programmable Power)
- Supported standards: IEC 61000-3-2; IEC 61000-3-3; IEC 61000-3-11; IEC 61000-3-12; IEC 61000-4-11; IEC 61000-4-13; IEC 61000-4-14; IEC 61000-4-17; IEC 61000-4-28; IEC 61000-4-29; IEC 61000-4-7; IEC 60725; IEC 60868
- AC source requirement: Requires Sequoia or Tahoe Series AC/DC source (up to 125 ARMS per phase)
- Included measurement system: PACS-3-75, OMNI-3-37MX, OMNI-3-75
- Included software: CIC651 (CTSH) and CIC652 (CTSL)
- DAQ: Integrated PCIe DAQ card with direct PC-bus streaming
- Flicker meter: IEC 60868-compliant PACS + DSP
- Cabinet: 43" cabinet for lumped impedance (OMNI series)
- PC requirements: Pentium 4 or better, 256 MB RAM or more, 20 GB HDD, Color SVGA, PCI slot for A/D card
- Outputs / capabilities: Harmonics and inter-harmonics measurement, flicker measurement, continuous pass/fail monitoring, detailed IEC-compliant reporting