As of August 25, 2021, the LS 13 320 XR and LS 13 320 particle size analyzers are obsolete and no longer available for purchase. Please use the button below to download LS 13 320 XR obsolescence letter for additional details including affected part numbers and our plans to provide ongoing service and support.
For big improvements that help you spot small differences.
The LS 13 320 XR offers best-in-class particle size distribution data from advanced PIDS technology,* which enables high-resolution measurements and an expanded dynamic range. Like the LS 13 320, the XR particle size analyzer provides fast, accurate results, and helps you streamline workflows to optimize efficiency. Some big improvements help you reliably spot small differences that can have a huge impact on your particle analysis data.
Direct measurement range from 10 nm – 3,500 µm
Automatically highlights pass/fail results for faster quality control
Enhanced software that simplifies method creation for standardized measurements
New control standards to adequately verify instrument/module performance
Spot Small Differences
Expanded measurement range: 10 nm – 3,500 µm
Laser diffraction plus advanced Polarization Intensity Differential Scattering (PIDS) technology enable high-resolution measurement & reporting of real data down to 10 nm
Provides accurate, reliable detection of multiple particle sizes in a single sample
ADAPT Software features automatic pass/fail check
Pre-configured methods deliver results with 3 clicks or less
Simplifies analyzer operation by experts & novice users alike
1-click overlay with historical data