OverviewBettersizer 2600 Plus combines laser diffraction and dual‑camera dynamic imaging on a modular platform to deliver complementary particle size and shape characterization across a wide measurement range (approx. 0.02–3500 μm, application dependent). The system supports both wet and dry dispersion configurations to accommodate diverse sample types and volumes.
Key features and benefits- Integrated size and shape analysis: laser diffraction for statistical particle size distributions and dual‑camera imaging for single‑particle size/shape metrics and visual traceability.
- Wide measurement span: designed to cover submicron fines through coarse particles in a single platform (application dependent).
- Modular dispersion: interchangeable wet and dry units for flexible sample preparation and solvent compatibility.
- High detector count and wide angular collection for robust PSDs across broad size ranges.
- Image evidence: particle images enable identification of agglomerates, oversized particles and irregular morphologies for QC and R&D workflows.
Advanced Laser Diffraction SystemThe laser diffraction module captures comprehensive scattering signals using a patented Fourier/inverse‑Fourier optical arrangement and a 92‑detector array. Analysis applies Mie and Fraunhofer models as appropriate to derive repeatable particle size distributions.
Confidence for optically challenging samplesThe instrument includes a refractive‑index measurement capability to validate optical input for Mie modeling, improving confidence when working with optically complex or unknown materials.
Performance highlights- Measurement range coverage from fine to coarse particles; complete measurements possible in as little as ~10 s (application dependent).
- Design targets accuracy and repeatability suitable for QA/QC and R&D (reported examples show performance better than 0.5% where applicable).
Dual‑Camera Dynamic Imaging SystemThe PIC‑1 dual‑camera imaging module acquires high‑speed particle images during measurement to produce size and shape parameters and to capture traceable single‑particle images. Modes include imaging‑only and combined imaging + laser diffraction workflows.
Modular design and dispersion flexibilityThe platform supports multiple wet and dry dispersion units to adapt to different sample matrices, volumes and solvents, enabling a single instrument to address multiple applications across industries.
Software and dataCombined measurements produce complementary size and shape outputs in a single dataset. Particle images and derived statistics are exportable for audit trails, QC documentation and advanced morphology analysis.
Technical specifications- Model: Bettersizer 2600 Plus
- Technology: Laser diffraction + dual‑camera dynamic imaging (modular)
- Overall platform capability: nominally 0.02–3500 μm (application and configuration dependent)
- Laser diffraction typical range: 0.02–2600 μm (system dependent)
- Dynamic imaging (PIC‑1) range: 2–3500 μm
- Detector: 92‑detector array
- Angular coverage: ~0.016°–165°
- Sample cell: tilted design to reduce total internal reflection
- Imaging magnifications: 0.5× and 10×; frame rate: 70 fps
- Reported measurement time: complete measurements in as little as 10 s (application dependent)
- Accuracy / repeatability: reported better than 0.5% (where applicable)
- Imaging outputs: up to 32 size & shape parameters and particle images
- Dispersion: modular wet and dry units supported
- Standards: laser diffraction designed to meet ISO 13320 where applicable
- Optical system: patented Fourier / inverse‑Fourier optics
- Manufacturer: Bettersize Instruments